Embedded Technology

Conference

Design and Verification Tool Track Free/Pre-Registration Required

11.20[wed] 10:30-11:15 Exhibition Hall Conference C
Version management of large data in a distributed development
Kikuo Okano
Lead SCM Designer, Software Solution,
TOYO Corporation

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11.20[wed] 11:30-12:15 Exhibition Hall Conference C
Software Product Line Development : Get tips on reuse
- Cursed with version hell ? -
Yoshio Asano
COO, Electronics Division,
Fujisetsubi Corp.

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11.20[wed] 12:30-13:15 Exhibition Hall Conference C
Workflow for Implementing Programmable SoC with Model-Based Design
Atsushi Matsumoto
Senior Application Engineer, Application Engineering Group,
MathWorks Japan

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11.20[wed] 13:30-14:15 Exhibition Hall Conference C
Improving the Quality of Model-Based Test Design
- Breaking Away From Test Designing That Relies on Hunch, Experience and Boldness -
Ryuko Yoshikawa
Manager, Sales Group Product Div.
CATS CO.,LTD.

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11.20[wed] 14:30-15:15 Exhibition Hall Conference C
Fastest way to using NI LabVIEW for embedded programming, to reduce development time by half
- Standardized platform for Real-time OS, FPGA, and Windows -
Chizuru Amanuma
Product Marketing Engineer, Marketing, Technical Marketing,
National Instruments Japan Corporation

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11.20[wed] 15:30-16:15 Exhibition Hall Conference C
SysML Requirements Diagram and Requirements Management
- Idea to Use Requirements Diagram -
Takeshi Kouno
CEO, SparxSystems Japan Co.,Ltd.

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11.21[thu] 10:30-11:15 Exhibition Hall Conference C
Virtualization of development platforms and how to bring out the value
Yasuhiro Yoshimoto
Application Engineer, WW Embedded Systems Channel,
Mentor Graphics Japan Co., Ltd.

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11.21[thu] 11:30-12:15 Exhibition Hall Conference C
Hardware/Software Co-Simulation with Simics.
- Breakthrough Using Full System Simulation -
Takeshi Takayama
Senior Engineer, Engineering Department,
IT Access Co.Ltd.

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11.21[thu] 12:30-13:15 Exhibition Hall Conference C
Product and Technology Overview of Yogitech's Software Test Library-fRSTL- for Functional Safety
Hiroo Suyama
Business Development Manager, New Business Promotion Office,
eSOL Co., Ltd.

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11.21[thu] 13:30-14:15 Exhibition Hall Conference C
Development of the Advanced Battery Management System (MBS)
Takashi Miyano
Director, Solution Engineering Department,
dSPACE Japan K.K.

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11.21[thu] 14:30-15:15 Exhibition Hall Conference C
Issues and Measures Related to the Shift to Model-Based Development
Takashi Mishima
Chief Specialist, Embedded System Division,
TOSHIBA INFORMATION SYSTEMS (JAPAN) CORPORATION

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11.21[thu] 15:30-16:15 Exhibition Hall Conference C
Can't stop the system? Software verification by dynamic analysis can help you!
- Most recent debugging approach for the real-time control system -
Masahiro Takeshima
Department Manager, Business Promotion Dept.1
Embedded Products Business Headquarters,
Yokogawa Digital Computer Corporation

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11.22[fri] 10:30-11:15 Exhibition Hall Conference C
Introducing an efficient method of reviewing the results of static analysis tool
Hirofumi Makita
Senior Engineer, SPQA Group, Embedded Testing Division,
A. I. Corporation

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11.22[fri] 11:30-12:15 Exhibition Hall Conference C
Economic contribution of Static Analysis for loss caused by bugs and security vulnerabilities in source code
Takuya Tamaki
Deputy General Manager, Enterprise Solutions Div. Business Promotion Dept.
Marubeni Information Systems Co,.Ltd.

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11.22[fri] 12:30-13:15 Exhibition Hall Conference C
Strengthening Development Abilities Through Quality Coding and Testing
- Recommendation of Development Tests -
Yukio Yasutake
Sr. Manager, APAC Marketing,
Coverity Inc.

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11.22[fri] 13:30-14:15 Exhibition Hall Conference C
Getting Real Movements and Shift Toward the Scalable Software Development
- The Concept of Dynamic Software Measuring
Masashi Arai
Manager, Sales department Technical support division,
Heartland.Data Co., Ltd.

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11.22[fri] 14:30-15:15 Exhibition Hall Conference C
Embedded agile software development from Test Driven Development (TDD)
Kazutoshi Kitta
Manager, Software Engineering Technical Department,
TechMatrix Corporation

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11.22[fri] 15:30-16:15 Exhibition Hall Conference C
Migration from 8/16-bit to 32-bit MCUs
- Tips on Versatile Porting Techniques -
Hiroki Akaboshi
Team Leader, Engieering Team,
IAR Systems K,K.

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